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Home > Detail: How Testers Can Use a Software Reliability Engineering Maturity Model on Their Web Sites


View Content Detail: XDD1457filelistfilename1.pdf (98 Kb) This paper was originally presented at STAREAST '99 a conference produced by Software Quality Engineering. For more information on this conference, visit the current STAREAST Web site.
About the Author John D. Musa is an Independent Senior Consultant in software reliability engineering. He has more than 30 years’ experience as software practitioner and manager in a wide variety of development projects. He is one of the creators of the field of software reliability engineering and is widely recognized as the leader in reducing it to practice. He was recently Technical Manager of Software Reliability Engineering (SRE) at AT&T Bell Laboratories, Murray Hill, NJ.
He has been involved in SRE since 1973. His many contributions include the two most widely-used models (one with K. Okumoto), the concept and application of the operational profile, and the integration of SRE into all phases of the software development cycle. Musa has published some 100 articles and papers, given more than 175 major presentations, and made a number of videos. He is principal author of the widely-acclaimed pioneering book, Software Reliability: Measurement, Prediction, Application and author of the new book, Software Reliability Engineering: More Reliable Software, Faster Development and Testing.
He organized and led the transfer of SRE into practice within AT&T, spearheading the effort that defined it as a “best current practice.” He was actively involved in research to advance the theory and practice of the field. Musa has been an international leader in its dissemination.
Listed in Who’s Who in America and American Men and Women of Science, he is an international leader in software engineering and a Fellow of the IEEE, cited for “contributions to software engineering, particularly software reliability”. He was recognized in 1992 as the individual who had that year contributed the most to testing technology. He was co-founder of the IEEE Committee on SRE. He has very extensive international experience as a lecturer and teacher.
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